ITBM&S Workshop
Fraunhofer IOSB Instituts building Ettlingen

Logo ITBM&S

Wilson Square Toulouse

 

ITBM&S 2017
Ettlingen

ITBM&6 2016
Carcassonne

ITBM&S 2014
Ettlingen

 

Contact

 

Ettlingen

Toulouse

 

Home Page of ITBM&S

the International Workshop on

Infrared Target and Background
Modeling and Simulation


Next Workshop 'ITBM&S 2017' scheduled to

26-29 June, 2017

will be hosted by Fraunhofer IOSB, Ettlingen, Germany



The workshop is co-organized by Onera and Fraunhofer IOSB
in close cooperation with companies having highest expertise
in the field of IR modeling and simulation.

 
Logo-IOSB Logo-ONERA
Fraunhofer IOSB
Fraunhofer Institute of Optronics,
System Technolgies and Image Exploitation
ONERA
The French Aerospace Lab

 

Former Workshops

WS
Nr.
WS
Name
Date
Year
Hosted by
Venue
Electronic
Distribution
1
ITBM
June 27-30
2005
FGAN-FOM
Ettlingen
CD
2
ITBM&S
June 26-29
2006
FGAN-FOM
Ettlingen
DVD
3
ITBM&S
June 25-28
2007
ONERA DOTA
Toulouse
DVD
4
ITBM&S
June 23-26
2008
FGAN-FOM
Ettlingen
CD
5
ITBM&S
June 22-25
2009
ONERA DOTA
Toulouse
CD
6
ITBM&S
June 21-24
2010
Fraunhofer IOSB
Ettlingen
CD
7
ITBM&S
June 27-30
2011
ONERA DOTA
Toulouse
CD
8
ITBM&S
June 25-28
2012
Fraunhofer IOSB
Ettlingen
--
9
ITBM&S
June 10-13
2013
ONERA DOTA
Toulouse
--
10
ITBM&S
June 23-26
2014
Fraunhofer IOSB
Ettlingen
DVD
11
ITBM&S
June 27-30
2016
ONERA DOTA
Carcassonne
t.b.d.



Workshop supported by:


ThermoAnalytics Inc.
Providers of engineering services and software for advanced thermal and infrared signature analysis
TAI-Logo
Oktal Synthetic Environment
Specialist in simulation and synthetic environments
OKTAL-Logo
Davis Engineering
A world leader in infrared stealth technology and signature modelling
DAVIS-Logo
Santa Barbara Infrared, Inc. (SBIR)
Preferred supplier to all of the leading manufacturers and integrators of E-O sensors and sensor systems
SBIR-Logo
Lacroix
Providers of solutions and services in
self-protection, training systems,
pyrotechnic devices and components
Surface Optics Corporation
Specialized in the characterization and exploitation of the optical properties of surfaces
SOC